TY  - JOUR
AU  - Vaudin, Mark
AU  - Gerbig, Yvonne
AU  - Stranick, Stephan
AU  - Cook, Robert
C2  - Applied Physics Letters
DA  - 2008-12-12
LA  - en
M1  - 93
PB  - Applied Physics Letters
PY  - 2008
TI  - Comparison of Nanoscale Measurements of Strain and Stress using Electron Back Scattered Diffraction and Confocal Raman Microscopy
ER  -