TY  - CONF
AU  - Wang, Chen
AU  - Yu, Liangchun
AU  - Campbell, Jason
AU  - Cheung, Kin
AU  - Xuan, Yi
AU  - Ye, Peide
AU  - Suehle, John
AU  - Zhang, David
C2  - 2009 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP
, Reno, NV
DA  - 2009-10-19
LA  - en
PB  - 2009 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP
, Reno, NV
PY  - 2009
TI  - An Improved Fast I<sub> d </sub>-V ^d g Measurement Technology With Expanded Application Range
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904155
ER  -