TY  - CONF
AU  - Yoon, Howard
AU  - Allen, David
AU  - Eppeldauer, George
AU  - Tsai, Benjamin
C2  - SPIE, San Diego, CA
DA  - 2009-08-21
LA  - en
PB  - SPIE, San Diego, CA
PY  - 2009
TI  - The Extension of the NIST BRDF Scale from 1100 nm to 2500 nm
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904078
ER  -