TY  - CONF
AU  - Jarrett, Dean
AU  - Kraft, Marlin
AU  - Castro, Isabel
AU  - Degler, Brett
AU  - Evans, Mark
C2  - NCSL International Workshop and Symposium, Orlando, FL
DA  - 2008-08-01
LA  - en
PB  - NCSL International Workshop and Symposium, Orlando, FL
PY  - 2008
TI  - Procedures for the Traceability of High Resistance Standards Using a Teraohmmeter
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33020
ER  -