TY  - CONF
AU  - Windover, Donald
AU  - Gil, David
AU  - Henins, Albert
AU  - Cline, James
C2  - 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics , Albany, NY
DA  - 2009-10-30
DO  - https://doi.org/10.1063/1.3251259
LA  - en
M1  - 1173
PB  - 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics , Albany, NY
PY  - 2009
TI  - NIST High Resolution X-Ray Diffraction Standard Reference Material: SRM 2000
ER  -