TY  - JOUR
AU  - Ryan, Jason
AU  - Zou, Jibin
AU  - Campbell, Jason
AU  - Southwick, Richard
AU  - Cheung, Kin
AU  - Oates, Anthony
AU  - Huang, Rue
C2  - IEEE Transactions on Electron Devices
DA  - 2015-02-13
LA  - en
PB  - IEEE Transactions on Electron Devices
PY  - 2015
TI  - Frequency Modulated Charge Pumping with Extremely High Gate Leakage
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=915883
ER  -