TY  - JOUR
AU  - Ryan, Jason
AU  - Southwick, Richard
AU  - Campbell, Jason
AU  - Cheung, Kin
AU  - Suehle, John
AU  - Oates, Anthony
C2  - IEEE Electron Device Letters
DA  - 2013-02-28
DO  - https://doi.org/10.1109/LED.2013.2251315
LA  - en
PB  - IEEE Electron Device Letters
PY  - 2013
TI  - Frequency-Modulated Charge Pumping: Defect Measurements with High Gate Leakage
ER  -