TY  - GEN
AU  - Mulholland, George
AU  - Donnelly, Michelle
AU  - Hagwood, Robert
AU  - Kukuck, S
AU  - Hackley, Vincent
AU  - Pui, D
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2006-08-01
LA  - en
M1  - 111 No. 4
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2006
TI  - Measurement of 100 nm and 60 nm Particle Standards by Differential Mobility Analysis
ER  -