TY  - CONF
AU  - Vecchia, Dominic
AU  - Wang, Chih-Ming
AU  - Young, M.
C2  - Proc., Measurement Science Conference, Los Angeles, CA, USA
DA  - 1993-01-01 00:01:00
LA  - en
PB  - Proc., Measurement Science Conference, Los Angeles, CA, USA
PY  - 1993
TI  - Outlier-Resistant Fitting of Gray-Scale Images Illustrated by Optical Fiber Geometry
ER  -