TY  - CONF
AU  - Suehle, John
AU  - Gallo, Kathleen
C2  - IEEE  International Conference on Microelectronic Test Structures, Long Beach, CA, USA
DA  - 1988-12-31 00:12:00
LA  - en
PB  - IEEE  International Conference on Microelectronic Test Structures, Long Beach, CA, USA
PY  - 1988
TI  - Test Circuit Structures for Characterizing the Effects of Localized Hot-Carrier-Induced Charge in VLSI Switching Circuits
ER  -