TY  - JOUR
AU  - Yarimbiyik, Emre
AU  - Schafft, Harry
AU  - Allen, Richard
AU  - Zaghloul, Mona
AU  - Blackburn, David
C2  - Microelectronics Reliability
DA  - 2006-07-01 00:07:00
LA  - en
M1  - 46
PB  - Microelectronics Reliability
PY  - 2006
TI  - Modeling and Simulation of Resistivity of Nanometer Scale Copper
ER  -