TY  - CONF
AU  - Scheinfein, M
AU  - Unguris, John
AU  - Pierce, Daniel
AU  - Celotta, Robert
C2  - XIIth International Congress for Electron Microscopy, Seattle, WA, USA
DA  - 1990-01-01 00:01:00
LA  - en
PB  - XIIth International Congress for Electron Microscopy, Seattle, WA, USA
PY  - 1990
TI  - Surface Magnetic Microstructural Analysis Using Scanning Electron Microscopy with Polarization Analysis (SEMPA)
ER  -