TY  - CONF
AU  - Gupta, R
AU  - Kubarych, Zeina
AU  - McClelland, Jabez
AU  - Celotta, Robert
C2  - Conference on Industrial Applications of Scanned Probe Microscopy, Gaithersburg, MD, USA
DA  - 1994-01-01 00:01:00
LA  - en
PB  - Conference on Industrial Applications of Scanned Probe Microscopy, Gaithersburg, MD, USA
PY  - 1994
TI  - Pitch Standards via Laser-Focused Deposition
ER  -