TY  - CONF
AU  - Geiss, Roy
AU  - Keller, Robert
AU  - Read, David
AU  - Cheng, Yi-Wen
C2  - Thin Films - Stresses and Mechanical Properties XI, San Francisco, CA, USA
DA  - 2005-04-01 00:04:00
LA  - en
M1  - 863
PB  - Thin Films - Stresses and Mechanical Properties XI, San Francisco, CA, USA
PY  - 2005
TI  - TEM Analysis of Deformation in Thin Films of Aluminum after both AC Thermomechanical and Tensile Deformation
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50149
ER  -