TY  - JOUR
AU  - Zhang, Nien
AU  - Postek, Michael
AU  - Larrabee, Robert
C2  - Metrologia
DA  - 1996-01-01 00:01:00
LA  - en
M1  - 34
PB  - Metrologia
PY  - 1996
TI  - Statistical Models for Estimating the Measurement of Pitch in Metrology Instruments
ER  -