TY  - GEN
AU  - Lyons, Kevin
AU  - Lee, Yung-Tsun
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2003-08-01
DO  - https://doi.org/10.6028/jres.109.018
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2003
TI  - Software Architecture of Virtual Environment for Nano Scale Assembly (VENSA)
ER  -