TY  - CONF
AU  - Hernandez, Madelaine
AU  - Akuffo, Adwoa
AU  - Hood, Colleen
AU  - Ortiz, Jose
AU  - Jr., Allen Hefner
C2  - Proc., Power Electronics Specialist Conference, Orlando, FL, USA
DA  - 2007-06-21 00:06:00
LA  - en
PB  - Proc., Power Electronics Specialist Conference, Orlando, FL, USA
PY  - 2007
TI  - Experimental Evaluation of SiC PiN Diode Forward Bias Degradation and Long Term Stability
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32667
ER  -