TY  - CONF
AU  - Clement, Tracy
AU  - Verbeyst, Frans
AU  - Pintelon, Rik
AU  - Rolain, Yves
AU  - Schoukens, Johan
C2  - Proc., IEEE Instrum. Meas. Tech. Conf., Warsaw, 1, PL
DA  - 2007-05-01 00:05:00
LA  - en
PB  - Proc., IEEE Instrum. Meas. Tech. Conf., Warsaw, 1, PL
PY  - 2007
TI  - System identification approach applied to drift estimation
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32476
ER  -