TY  - CONF
AU  - Remley, Kate
AU  - Hale, Paul
AU  - Bergman, David
AU  - Keenan, Darryl
C2  - ARFTG Microwave Measurement Conference Digest, Washington, DC, USA
DA  - 2006-12-01 00:12:00
LA  - en
PB  - ARFTG Microwave Measurement Conference Digest, Washington, DC, USA
PY  - 2006
TI  - Comparison of Multisine Measurements from Instrumentation Capable of Nonlinear System Characterization
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32130
ER  -