TY  - CONF
AU  - Yarimbiyik, Emre
AU  - Schafft, Harry
AU  - Allen, Richard
AU  - Zahgoul, Mona
AU  - Blackburn, David
C2  - IEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA
DA  - 2005-10-20 00:10:00
LA  - en
PB  - IEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA
PY  - 2005
TI  - Resistivity of Nanometer-Scale Films and Interconnects: Model and Simulation
ER  -