TY  - CONF
AU  - Zhu, Baozhong
AU  - Suehle, John
AU  - Vogel, Eric
AU  - Berstein, Joseph
C2  - IEEE International Reliability Physics Symposium Proceedings, San Jose, CA, USA
DA  - 2005-04-20 00:04:00
LA  - en
PB  - IEEE International Reliability Physics Symposium Proceedings, San Jose, CA, USA
PY  - 2005
TI  - The Contribution of HfO2 Bulk Oxide Traps to Dynamic NBTI in pMOSFETs
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31914
ER  -