TY  - JOUR
AU  - Lai, Jih-Sheng
AU  - Yu, H.
AU  - Zhang, J.
AU  - Li, Y.
AU  - Sheng, Kuang
AU  - Zhao, J.H.
AU  - Jr., Allen Hefner
C2  - IEEE Transactions on Industry Applications
DA  - 2005-10-01 00:10:00
LA  - en
PB  - IEEE Transactions on Industry Applications
PY  - 2005
TI  - Characterization of Normally-off SiC Vertical JFET Devices and Inverter Circuits
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32300
ER  -