TY  - GEN
AU  - Laug, Owen
AU  - Bergman, David
AU  - Souders, T.
AU  - Waltrip, Bryan
C2  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2008-06-01 00:06:00
LA  - en
PB  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2008
TI  - A Next Generation Sampling Comparator Probe For The NIST Sampling Waveform Analyzer
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32891
ER  -