TY  - CONF
AU  - Wallis, Thomas
AU  - Imtiaz, Atif
AU  - Nembach, Hans
AU  - Rice, Paul
AU  - Kabos, Pavel
C2  - 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (formerly titled Characterization and Metrology for ULSI Technology), Gaithersburg, MD, USA
DA  - 2007-03-27 00:03:00
LA  - en
PB  - 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (formerly titled Characterization and Metrology for ULSI Technology), Gaithersburg, MD, USA
PY  - 2007
TI  - Metrology for High-Frequency Nanoelectronics
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32626
ER  -