TY  - CONF
AU  - Zhu, Baozhong
AU  - Suehle, John
AU  - Berstein, Joseph
C2  - Proc. Integrated Reliability Workshop, Lake Tahoe, CA, USA
DA  - 2004-10-21 00:10:00
LA  - en
PB  - Proc. Integrated Reliability Workshop, Lake Tahoe, CA, USA
PY  - 2004
TI  - Mechanism of Dynamic NBTI of pMOSFETs
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31642
ER  -