TY  - JOUR
AU  - Han, Jin-Ping
AU  - Vogel, Eric
AU  - Gusev, Evgeni
AU  - D'Emic, C.
AU  - Richter, Curt
AU  - Heh, Da-Wei
AU  - Suehle, John
C2  - Electron Device Letters
DA  - 2004-03-01 00:03:00
LA  - en
M1  - 25
PB  - Electron Device Letters
PY  - 2004
TI  - Asymmetric Energy Distribution of Interface Traps in n- & p- MOSFETs with HfO2 Gate Dielectric on Ultra-thin SiON Buffer Layer
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31451
ER  -