TY  - CONF
AU  - Berning, David
AU  - Jr., Allen Hefner
AU  - Rodriguez, J
AU  - Hood, Colleen
AU  - Rivera, Angel
C2  - Proc., IEEE Industrial Applications Society Meeting, Tampa, FL, USA
DA  - 2006-10-01 00:10:00
LA  - en
PB  - Proc., IEEE Industrial Applications Society Meeting, Tampa, FL, USA
PY  - 2006
TI  - Generalized Test Bed for High-Voltage, High-Power SiC Device Characterization
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32317
ER  -