TY  - CONF
AU  - Gergel-Hackett, Nadine
AU  - Hacker, Christina
AU  - Richter, Lee
AU  - Kirillov, Oleg
AU  - Richter, Curt
C2  - 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, MD, USA
DA  - 2007-09-30 00:09:00
LA  - en
PB  - 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, MD, USA
PY  - 2007
TI  - The Characterization of Silicon-Based Molecular Devices
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32615
ER  -