TY  - CONF
AU  - Wohlwend, Harvey
AU  - Crispieri, Gino
AU  - Li-Baboud, Ya-Shian
C2  - AEC/APC Symposium XVIII, Westminster, CO, USA
DA  - 2006-09-30 00:09:00
LA  - en
PB  - AEC/APC Symposium XVIII, Westminster, CO, USA
PY  - 2006
TI  - Advancing Towards Factory-Wide Data Quality for APC Applications
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32423
ER  -