TY  - CONF
AU  - Duong, Tam
AU  - Berning, David
AU  - Jr., Allen Hefner
AU  - Smedley, Keyue
C2  - The Applied Power Electronics Conference and Exposition, Anaheim, CA, USA
DA  - 2007-02-25 00:02:00
LA  - en
PB  - The Applied Power Electronics Conference and Exposition, Anaheim, CA, USA
PY  - 2007
TI  - Long-Term Stability Test System for High-Voltage, High-Frequency SiC Power Devices
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32547
ER  -