TY - JOUR AU - Heh, Da-Wei AU - Vogel, Eric AU - Bernstein, J AU - Yang, Chadwin AU - Brown, George AU - Bersuker, Gennadi AU - Hung, Pui-Yee AU - Diebold, Alain C2 - IEEE Electronic letters DA - 2006-04-01 00:04:00 LA - en M1 - 88 PB - IEEE Electronic letters PY - 2006 TI - Spatial Distributions of Trapping Centers in HfO2/SiO2 Stacked Dielectrics UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32009 ER -