TY  - JOUR
AU  - Han, Jin-Ping
AU  - Koo, Sang-Mo
AU  - Vogel, Eric
AU  - Gusev, Evgeni
AU  - D'Emic, C.
AU  - Richter, Curt
AU  - Suehle, John
C2  - Microelectronics Reliability
DA  - 2005-02-28 00:02:00
LA  - en
M1  - 45
PB  - Microelectronics Reliability
PY  - 2005
TI  - Reverse Short Channel Effects in High-k Gated nMOSFETs
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32101
ER  -