TY  - CONF
AU  - Krupka, Jerzy
AU  - Baker-Jarvis, James
AU  - Geyer, Richard
C2  - Proc., Intl. Microwave Conf. MIKON, Warsaw, 1, PL
DA  - 2000-05-01 00:05:00
LA  - en
M1  - 1
PB  - Proc., Intl. Microwave Conf. MIKON, Warsaw, 1, PL
PY  - 2000
TI  - Complex Permittivity Measurements of Single-Crystal and Ceramic Strontium Titanate at Microwave Frequencies and Cryogenic Temperatures
ER  -