TY  - JOUR
AU  - Tulchinsky, D.
AU  - Kelley, Michael
AU  - Bass, J.
AU  - Unguris, John
AU  - Dura, Joseph
AU  - Borchers, Julie
AU  - Majkrzak, Charles
AU  - Hsu, S.
AU  - Loloee, R.
AU  - Pratt, W.
C2  - Journal of Applied Physics
DA  - 2000-05-01 00:05:00
LA  - en
M1  - 87
PB  - Journal of Applied Physics
PY  - 2000
TI  - Magnetic depth profiling Co/Cu multilayers to investigate magnetoresistance (invited)
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32588
ER  -