TY  - JOUR
AU  - Delahay, F.
AU  - Witt, Thomas
AU  - Elmquist, Randolph
AU  - Dziuba, Ronald
C2  - Metrologia
DA  - 2000-01-01 00:01:00
LA  - en
M1  - 37
PB  - Metrologia
PY  - 2000
TI  - Comparison of Quantum Hall Effect Resistance Standards of the NIST and the BIPM
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=7317
ER  -