TY  - GEN
AU  - Lee, Kevin
AU  - Cage, Marvin
AU  - Rowe, P.
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1994-05-01 00:05:00
LA  - en
M1  - 99
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1994
TI  - Sources of Uncertainty in a DVM-Based Measurement System for a Quantized Hall Resistance Standard
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=15964
ER  -