TY  - JOUR
AU  - Jeffery, Anne-Marie
AU  - Elmquist, Randolph
AU  - Shields, John
AU  - Lee, Lai
AU  - Cage, Marvin
AU  - Shields, Scott
AU  - Dziuba, Ronald
C2  - Metrologia
DA  - 1998-06-01 00:06:00
LA  - en
PB  - Metrologia
PY  - 1998
TI  - Determination of the Von Klitzing Constant and the Fine-Structure Constant Through a Comparison of the Quantized Hall Resistance and the Ohm Derived from the NIST Calculable Capacitor
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=3449
ER  -