TY  - CONF
AU  - Koo, Sang-Mo
AU  - Li, Qiliang
AU  - Edelstein, Monica
AU  - Richter, Curt
AU  - Vogel, Eric
C2  - 2005 International Semiconductor Device Research Symposium, Bethesda, MD, USA
DA  - 2005-12-09 00:12:00
LA  - en
PB  - 2005 International Semiconductor Device Research Symposium, Bethesda, MD, USA
PY  - 2005
TI  - Silicon Nanowire Field Effect Transistor Test Structures Fabricated by Top-down Approaches
ER  -