TY  - JOUR
AU  - Tachikawa, K
AU  - Itoh, K
AU  - Wada, H
AU  - Gould, D
AU  - Jones, H
AU  - Walters, C
AU  - Goodrich, Loren
AU  - Ekin, John
AU  - Bray, S
C2  - IEEE Transactions on Magnetics
DA  - 1989-03-01 00:03:00
LA  - en
PB  - IEEE Transactions on Magnetics
PY  - 1989
TI  - VAMAS Intercomparison of Critical Current Measurement in Nb<sub>3</sub>Sn Wires
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30432
ER  -