TY  - JOUR
AU  - Chong, Yonuk
AU  - Dresselhaus, Paul
AU  - Benz, Samuel
AU  - Bonevich, John
C2  - Applied Physics Letters
DA  - 2003-04-14 00:04:00
LA  - en
M1  - 82
PB  - Applied Physics Letters
PY  - 2003
TI  - Effects of interlayer electrode thickness in Nb/(MoSi<sub>2</sub>/Nb)<sub>N</sub> stacked Josephson junctions
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30885
ER  -