TY  - CONF
AU  - Suehle, John
AU  - Chaparala, P
AU  - Messick, C.
AU  - Miller, W.
AU  - Boyko, K.
C2  - Proc., 1994 IEEE International Reliability Physics Symposium, San Jose, CA, USA
DA  - 1994-12-31 00:12:00
LA  - en
PB  - Proc., 1994 IEEE International Reliability Physics Symposium, San Jose, CA, USA
PY  - 1994
TI  - Field and Temperature Acceleration of Time-Dependent Dielectric Breakdown in Intrinsic Thin SiO<sub>2</sub>
ER  -