TY  - JOUR
AU  - Vogel, Eric
AU  - Suehle, John
AU  - Wang, Bin
AU  - Chen, Y
AU  - Bernstein, J
C2  - IEEE Transactions on Electron Devices
DA  - 2000-06-01 00:06:00
LA  - en
M1  - 47
PB  - IEEE Transactions on Electron Devices
PY  - 2000
TI  - Reliability of Ultra-Thin Silicon Dioxide Under Combined Substrate Hot Electron and Constant Voltage Tunneling Stress
ER  -