TY  - GEN
AU  - Baker-Jarvis, James
AU  - Jones, Chriss
AU  - Riddle, Billy
C2  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1998-11-01 00:11:00
LA  - en
M1  - 1509
PB  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1998
TI  - Electrical Properties and Dielectric Relaxation of DNA in Solution
ER  -