TY  - JOUR
AU  - Henson, W.
AU  - Yong, N.
AU  - Kubicek, S.
AU  - Vogel, Eric
AU  - Wortman, J.
AU  - Meyer, K. De
AU  - Naem, A.
C2  - IEEE Transactions on Electron Devices
DA  - 2000-07-01 00:07:00
LA  - en
M1  - 47
PB  - IEEE Transactions on Electron Devices
PY  - 2000
TI  - Analysis of Leakage Currents and Impact on Off-State Power Consumption for CMOS Technology in the 100 nm Regime
ER  -