TY  - CONF
AU  - Han, X.
AU  - Heckert, N.
AU  - Filliben, James
AU  - Wang, Yicheng
C2  - Proc., IEEE Intl. Symp. on Electrical Insulation and Dielectric Phenomena (CEIDP), Atlanta, GA
DA  - 1998-10-01 00:10:00
LA  - en
M1  - II
PB  - Proc., IEEE Intl. Symp. on Electrical Insulation and Dielectric Phenomena (CEIDP), Atlanta, GA
PY  - 1998
TI  - Statistical Analysis of Partial Discharge Phenomena - Time of Occurrence Distributions
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=13362
ER  -