TY - CONF AU - Geyer, Richard AU - Baker-Jarvis, James AU - Krupka, Jerzy C2 - 2004 IEEE Conference on Electrical Insulation and Dielectric Phenomena, Boulder, CO, USA DA - 2004-10-20 00:10:00 LA - en PB - 2004 IEEE Conference on Electrical Insulation and Dielectric Phenomena, Boulder, CO, USA PY - 2004 TI - Dielectric Characterization of Single-Crystal LiF,CaF2,MgF2, BaF2, and SrF2 at Microwave Frequencyies ER -