TY  - CONF
AU  - Tang, Yi-hua
AU  - Sims, June
AU  - Kelley, Michael
C2  - Proc., Measurement Science Conference, Anaheim, CA
DA  - 2001-01-01 00:01:00
LA  - en
PB  - Proc., Measurement Science Conference, Anaheim, CA
PY  - 2001
TI  - Future Voltage Metrology at NIST
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=1327
ER  -