TY  - GEN
AU  - Baker-Jarvis, James
AU  - Janezic, Michael
AU  - Riddle, Billy
AU  - Holloway, Christopher
AU  - Paulter, Nicholas
AU  - Blendell, J
C2  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2001-07-01 00:07:00
DO  - https://doi.org/10.6028/NIST.TN.1520
LA  - en
PB  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2001
TI  - Dielectric and Conductor-Loss Characterization and Measurements on Electronic Packaging Materials
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=20484
ER  -