TY  - CONF
AU  - Gajewski, Donald
AU  - Nguyen, Nhan
AU  - Guyer, Jonathan
AU  - Kopanski, Joseph
AU  - Richter, Curt
AU  - Pellegrino, Joseph
C2  - 2000 Electronic Materials Conference Program, Denver, CO, USA
DA  - 2000-07-30 00:07:00
LA  - en
M1  - 29
PB  - 2000 Electronic Materials Conference Program, Denver, CO, USA
PY  - 2000
TI  - In Situ and Ex Situ Spectroscopic Ellipsometry of Low-Temperature-Grown GaAs
ER  -