TY  - CONF
AU  - Krupka, Jerzy
AU  - Pietruszko, S.
AU  - Geyer, Richard
AU  - Baker-Jarvis, James
AU  - Derzakowski, Kristof
C2  - Proc., Intl. Microwave Conf. MIKON, Warsaw, 1, PL
DA  - 1996-05-01 00:05:00
LA  - en
PB  - Proc., Intl. Microwave Conf. MIKON, Warsaw, 1, PL
PY  - 1996
TI  - SEMCconductors Resistivity Measurements Using Split-Dielectric Resonator Technique
ER  -